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This Document does not attempt to discuss statistical considerations
This Guide may be useful for materials other than silicon
SEMI D22-1109 (technical revision)
SEMI E138-0319 (technical revision)
and surface positioning of the marking symbol located outside of the quality area of glass substrates for FPD use
D04700 - SEMI D47 - Test Method for Measurement of Bent Cold Cathode Flourescent Lamps StdPbc-0822 This Document does not attemptThis standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. The purpose of this document is to standardize the method for measurement of electrical and optical characteristics of bent cold cathode fluorescent lamp (CCFL). Referenced SEMI Standards SEMI D35 Test Method